Inverse Problems in Medical Imaging and Nondestructive Testing: Proceedings of the Conference in Oberwolfach, Federal Republic of Germany, February 4-

ISBN-13: 9783211830154 / Angielski / Miękka / 1997 / 211 str.

Engl; Heinz W. Engl; Alfred K. Louis

Opis

These 14 papers present mathematical models for different imaging techniques in medicine and non-destructive testing. Readers are given insights into a modern field of scientific computing, with applications leading from the basics to actual research activities.

Recenzje

"... The articles are well written and the book is carefully edited, giving a well balanced survey of the most recent developments in this modern and important field of scientific computing." Internationale Mathematische Nachrichten 12/2001

Spis treści

Akduman, I., Grochmalicki, J., Pike, R.: Three-Dimensional Super-Resolving Confocal Scanning Laser Fluorescent Microscopy.- Beth, Th., et al.: Wavelets and Waves in Optical Signal Preprocessing.- Blaschke-Kaltenbacher, B., Engl, H.W.: Regularization Methods for Nonlinear Ill-Posed Problems with Applications to Phase Reconstruction.- Colton, D.L.: Qualitative Methods in Inverse Scattering Theory.- Dobson, D.C.: Recovery of Blocky Images in Electrical Impedance Tomography.- Järvenpää, S., Somersalo, E.: Impedance Imaging and Electrode Models. - Kress, R., Rundell, W.: Inverse Obstacle Scattering with Modulus of the Far Field Pattern as Data.- Langenberg, K.J., et al.: Applied Inversion in Nondestructive Testing.- Louis, A.K.: Application of the Approximate Inverse to 3D X-Ray CT and Ultrasound Tomography.- Maaß, P., Rieder, A.: Wavelet-Accelerated Tikhonov-Phillips Regularization with Applications.- Natterer, F.: An Initial Value Approach to the Inverse Helmholtz Problem at Fixed Frequency.- Pichot, Ch. et al.: Gradient and Newton-Kantorovich Methods for Microwave Tomography.- Pidcock, M., Ciullli, S., Ispas, S.: Boundary Modelling in Electrical Impedance Tomography.- Plato, R.: Lavrentiev’s Method for Linear Volterra Integral Equations of the First Kind, with Applications to the Non-Destructive Testing of Optical-Fibre Preforms.