Industrial Inspection with Open Eyes: Advances in Machine Vision Technology Zheng Liu, Hiroyuki Ukida, Kurt Niel, and Pradeep Ramuhalli
Part I: Advances in Technology
Infrared Vision: Visual Inspection Beyond the Visible Spectrum Clemente Ibarra-Castanedo, Stefano Sfarra, Marc Genest, and Xavier Maldague
Inspection Methods for Metal Surfaces: Image Acquisition and Algorithms for the Characterization of Defects Reinhold Huber-Mörk, Gustavo Fernández Dominguez, Svorad Stolc, Daniel Soukup, and Csaba Beleznai
FlexWarp, a Fast and Flexible Method for High-Precision Image Registration: A Non-Parametric Approach for Precise Image Registration Applied to Industrial Print Inspection Harald Penz, Franz Daubner, Ernst Bodenstorfer, and Reinhold Huber-Mörk
How Optical CMMs and 3D Scanning will Revolutionize the 3D Metrology World Jean-Francois Larue, Daniel Brown, and Marc Viala
Fast Three-Dimensional Shape Inspection Using a Multi-Sided Mirror Idaku Ishii
Efficient Completeness Inspection Using Real-Time 3D Color Reconstruction with a Dual-Laser Triangulation System Matteo Munaro, Edmond Wai Yan So, Stefano Tonello, and Emanuele Menegatti
X-Ray Computed Tomography for Non-Destructive Testing and Materials Characterization Johann Kastner and Christoph Heinzl
Defect Inspection for Curved Surfaces with a Highly Specular Reflection Zhong Zhang and Changjiang Li
Part II: Applications and System Integration for Vision-Based Inspection
Robotic Inspection Systems Christian Eitzinger, Sebastian Zambal, and Petra Thanner
Machine Vision Techniques for Condition Assessment of Civil Infrastructure Christian Koch, Zhenhua Zhu, Stephanie Paal, and Ioannis Brilakis
Smart Check 3D: An Industrial Inspection System Combining 3D Vision with Automatic Planning of Inspection View Points Nicola Carlon, Nicolò Boscolo, Stefano Tonello, and Emanuele Menegatti
Ultrasonic Evaluation and Imaging Susan L. Crawford, Michael T. Anderson, Aaron A. Diaz, Michael R. Larche, Matthew S. Prowant, and Anthony D. Cinson
Non-Destructive Visualization Using Electromagnetic Waves for Real and Practical Sensing Technology for Robotics Yoshihisa Fujii, Hiroyoshi Togo, Soichi Oka, and Yuko Fujiwara
Magneto-Optic Imaging and its Applications Yiming Deng, Yuhua Cheng, and Zhiwei Zeng
Dr. Zheng Liu is an Associate Professor at the University of British Columbia, Kelowna, BC, Canada. Dr. Hiroyuki Ukida is an Associate Professor in the Institute of Technology and Science at the University of Tokushima, Japan. Dr. Pradeep Ramuhalli is a Senior Research Scientist at the Pacific Northwest National Laboratory, Richland, WA, USA. Dipl.-Ing. Kurt Niel is the Head of the Department of Metrology and Control Engineering at the University of Applied Sciences Upper Austria, Wels, Austria.
This pioneering text/reference presents a detailed focus on the use of machine vision techniques in industrial inspection applications. An internationally renowned selection of experts provide insights on a range of inspection tasks, drawn from their cutting-edge work in academia and industry, covering practical issues of vision system integration for real-world applications.
Topics and features:
Presents a comprehensive review of state-of-the-art hardware and software tools for machine vision, and the evolution of algorithms for industrial inspection
Includes in-depth descriptions of advanced inspection methodologies and machine vision technologies for specific needs
Discusses the latest developments and future trends in imaging and vision techniques for industrial inspection tasks
Provides a focus on imaging and vision system integration, implementation, and optimization
Describes the pitfalls and barriers to developing successful inspection systems for smooth and efficient manufacturing process
Bridging the gap between theoretical knowledge and engineering practice, this indispensable book will appeal to graduate students interested in imaging, machine vision, and industrial inspection. The work also serves as an excellent reference for researchers seeking to develop innovative solutions to tackle practical challenges, and for professional engineers who will benefit from the coverage of applications at both system and component level.