Integrated Imaging and Vision Techniques for Industrial Inspection: Advances and Applications

ISBN-13: 9781447167402 / Angielski / Twarda / 2015 / 541 str.

Zheng Liu; Hiroyuki Ukida; Pradeep Ramuhalli

Opis

This pioneering text/reference presents a detailed focus on the use of machine vision techniques in industrial inspection applications. An internationally renowned selection of experts provide insights on a range of inspection tasks, drawn from their cutting-edge work in academia and industry, covering practical issues of vision system integration for real-world applications.Topics and features: presents a comprehensive review of state-of-the-art hardware and software tools for machine vision, and the evolution of algorithms for industrial inspection; includes in-depth descriptions of advanced inspection methodologies and machine vision technologies for specific needs; discusses the latest developments and future trends in imaging and vision techniques for industrial inspection tasks; provides a focus on imaging and vision system integration, implementation, and optimization; describes the pitfalls and barriers to developing successful inspection systems for smooth and efficient manufacturing process.Bridging the gap between theoretical knowledge and engineering practice, this indispensable book will appeal to graduate students interested in imaging, machine vision, and industrial inspection. The work also serves as an excellent reference for researchers seeking to develop innovative solutions to tackle practical challenges, and for professional engineers who will benefit from the coverage of applications at both system and component level.

Spis treści

Industrial Inspection with Open Eyes: Advances in Machine Vision Technology
Zheng Liu, Hiroyuki Ukida, Kurt Niel, and Pradeep Ramuhalli

Part I: Advances in Technology

Infrared Vision: Visual Inspection Beyond the Visible Spectrum
Clemente Ibarra-Castanedo, Stefano Sfarra, Marc Genest, and Xavier Maldague

Inspection Methods for Metal Surfaces: Image Acquisition and Algorithms for the Characterization of Defects
Reinhold Huber-Mörk, Gustavo Fernández Dominguez, Svorad Stolc, Daniel Soukup, and Csaba Beleznai

FlexWarp, a Fast and Flexible Method for High-Precision Image Registration: A Non-Parametric Approach for Precise Image Registration Applied to Industrial Print Inspection
Harald Penz, Franz Daubner, Ernst Bodenstorfer, and Reinhold Huber-Mörk

How Optical CMMs and 3D Scanning will Revolutionize the 3D Metrology World
Jean-Francois Larue, Daniel Brown, and Marc Viala

Fast Three-Dimensional Shape Inspection Using a Multi-Sided Mirror
Idaku Ishii

Efficient Completeness Inspection Using Real-Time 3D Color Reconstruction with a Dual-Laser Triangulation System
Matteo Munaro, Edmond Wai Yan So, Stefano Tonello, and Emanuele Menegatti

X-Ray Computed Tomography for Non-Destructive Testing and Materials Characterization
Johann Kastner and Christoph Heinzl

Defect Inspection for Curved Surfaces with a Highly Specular Reflection
Zhong Zhang and Changjiang Li

Part II: Applications and System Integration for Vision-Based Inspection

Robotic Inspection Systems
Christian Eitzinger, Sebastian Zambal, and Petra Thanner

Machine Vision Techniques for Condition Assessment of Civil Infrastructure
Christian Koch, Zhenhua Zhu, Stephanie Paal, and Ioannis Brilakis

Smart Check 3D: An Industrial Inspection System Combining 3D Vision with Automatic Planning of Inspection View Points
Nicola Carlon, Nicolò Boscolo, Stefano Tonello, and Emanuele Menegatti

Ultrasonic Evaluation and Imaging
Susan L. Crawford, Michael T. Anderson, Aaron A. Diaz, Michael R. Larche, Matthew S. Prowant, and Anthony D. Cinson

Non-Destructive Visualization Using Electromagnetic Waves for Real and Practical Sensing Technology for Robotics
Yoshihisa Fujii, Hiroyoshi Togo, Soichi Oka, and Yuko Fujiwara

Magneto-Optic Imaging and its Applications
Yiming Deng, Yuhua Cheng, and Zhiwei Zeng

O autorze

Dr. Zheng Liu is an Associate Professor at the University of British Columbia, Kelowna, BC, Canada. Dr. Hiroyuki Ukida is an Associate Professor in the Institute of Technology and Science at the University of Tokushima, Japan. Dr. Pradeep Ramuhalli is a Senior Research Scientist at the Pacific Northwest National Laboratory, Richland, WA, USA. Dipl.-Ing. Kurt Niel is the Head of the Department of Metrology and Control Engineering at the University of Applied Sciences Upper Austria, Wels, Austria.