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Kategorie szczegółowe BISAC

Integrated Circuit Test Engineering: Modern Techniques

ISBN-13: 9781846280238 / Angielski / Miękka / 2005 / 362 str.

Ian A. Grout
Integrated Circuit Test Engineering: Modern Techniques Ian A. Grout 9781846280238 Springer London Ltd - książkaWidoczna okładka, to zdjęcie poglądowe, a rzeczywista szata graficzna może różnić się od prezentowanej.

Integrated Circuit Test Engineering: Modern Techniques

ISBN-13: 9781846280238 / Angielski / Miękka / 2005 / 362 str.

Ian A. Grout
cena 362,27
(netto: 345,02 VAT:  5%)

Najniższa cena z 30 dni: 346,96
Termin realizacji zamówienia:
ok. 22 dni roboczych
Dostawa w 2026 r.

Darmowa dostawa!

Taking a three-pronged approach - test engineering from traditional-test, design and manufacturing view-points - Integrated Circuit Test Engineering encapsulates the subject as it stands today. After introductory background from basic testing rules to trends in technology, the reader learns about: fabrication processes; a complete range of detailed tests and procedures; how to design for testability; fault simulation; automatic test equipment and the economics of testing. The text incudes: Worked examples and exercises, well-organized references and bibliography. - An introduction to the use of various software and languages such as MATLAB, Spice, Verilog-HDL and VHDL. - A series of experiments based on material downloaded from springeronline.com showing how to construct a hardware test arrangement for MS Windows PCs. This book is a practical tool for advanced undergraduate and graduate electronic engineering students, a resource for their tutors and a guide for the practising electronic engineer.

Kategorie:
Technologie
Kategorie BISAC:
Technology & Engineering > Electronics - Circuits - General
Technology & Engineering > Electrical
Technology & Engineering > Electronics - General
Wydawca:
Springer London Ltd
Język:
Angielski
ISBN-13:
9781846280238
Rok wydania:
2005
Dostępne języki:
Angielski
Wydanie:
2006
Ilość stron:
362
Waga:
0.60 kg
Wymiary:
23.523.5 x 15.5
Oprawa:
Miękka
Wolumenów:
01
Dodatkowe informacje:
Bibliografia
Wydanie ilustrowane

to Integrated Circuit Test Engineering.- Fabrication Processes for Integrated Circuits.- Digital Logic Test.- Memory Test.- Analogue Test.- Mixed-Signal Test.- Input-Output Test.- Design for Testability — Structured Test Approaches.- System on a Chip (SoC) Test.- Test Pattern Generation and Fault Simulation.- Automatic Test Equipment (ATE) and Production Test.- Test Economics.

Doctor Ian Grout is a lecturer within the Department of Electronic and Computer Engineering at the University of Limerick. His research interests include microelectronic circuit design, control systems applications, design for test (digital and mixed-signal), test technology, CAD tool development and interfacing. He currently teaches microelectronic circuit design for electronic engineering students and test engineering for the final year electronic systems and VLSI Masters students. He is also the course leader for the Electronic Systems undergraduate programme within the university.

Doctor Grout has previously held positions with the UK Ministry of Defence and Defence Research Agency. He is currently the chair of the Educational ECAD (Electronic Computer Aided Design) User Group, UK, http://www.eeug.org.uk.

Nearly sixty years ago, the first successful demonstration of the transistor proved to be the herald of a new era of microelectronics. The ever-increasing complexity and functional speed of microelectronic circuits now containing tens of millions of transistors demand appropriate and rigorous test engineering activities during development and production. Test engineering must also be more closely interwoven with microelectronic design. An understanding of circuit test engineering is vital to any student desiring a career involving any stage in the design or manufacture of integrated circuits.

Taking a three-pronged approach – dealing with test engineering from traditional-test, design and manufacturing view-points – Integrated Circuit Test Engineering encapsulates the subject as it stands today. After an introduction covering background from basic testing rules to trends in technology, the reader learns about:

• fabrication processes;

• a diverse and complete range of detailed tests and procedures calculated to teach you all the tests you will require and how to choose which one(s) to use;

• how to design for testability;

• fault simulation;

• automatic test equipment and

• the economics of testing.

 

From a practical perspective, the text includes:

• A range of worked examples and exercises together with well-organized references and bibliography to aid further enquiry.

• An introduction to various software such as MATLAB® and Spice explaining their use in testing together with that of IEEE-standard hardware-description languages Verilog®-HDL and VHDL.

• A series of experiments based on material which can be freely downloaded from springeronline.com instructing you in the construction of a hardware test arrangement for MS Windows PCs (functionality, schematic and printed-circuit-board layout)with Visual Basic programs to drive the experiments.

 

Integrated Circuit Test Engineering provides a thorough-going and illuminating introduction to test engineering in analogue, digital and mixed-signal integrated circuits. This text is a valuable practical learning tool for advanced undergraduate and graduate electronic engineering students, an excellent teaching resource for their tutors and a useful guide for the practising electronic engineer.



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