Infrared Camera-based Imaging Techniques for Solar-grade Silicon : From First Principles to Industrial Feasibility

ISBN-13: 9783639126549 / Angielski / Miękka / 2009 / 160 str.

Peter Pohl

Opis

A major challenge for the rapidly growingphotovoltaic market is the reduction of productioncosts. Fast and reliable characterisation techniquesfor base materials are one possibility. This book isfocused on both developing and investigating thecapabilities of infrared (IR) camera-basedcharacterisation techniques feasable of measuring theefficiency limiting parameters of crystalline siliconsolar cell material. Three techniques areinvestigated, which measure the IR emission of eitherphotogenerated or bias-induced free excess carriersusing lock-in thermography. The ILM techniquemeasures the spatially resolved lifetime of chargecarriers in solar-grade silicon. Based on ourimproved setup lifetimes as short as 1µs aremeasurable in only 1s. The ITM technique allows theinvestigation of spatially distributedminority-carrier trapping centres in silicon wafers,whereas the ICM technique measures the spatiallyresolved capacitance, which can be used to generatemappings of the base-doping concentration of solarcells. This book is addressed to researchers as wellas companies in the field of photovoltaics and otherbussinesses willingly to apply camera-based imagingtechniques.

O autorze

Peter Pohl performed his doctoral dissertation at the Zentrum
für angewandte Energieforschung (ZAE) in Erlangen and at the
Institut für Solarenergieforschung Hameln (ISFH). He graduated at
the Gottfried Wilhelm Leibniz Universität Hannover in May 2007.
Since 2007 he works as technical engineer in the energy sector.