Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists

ISBN-13: 9780367357948 / Angielski / Twarda / 2022 / 272 str.

Dong Zhili

Opis

The goal of this textbook is to effectively equip readers with an in-depth understanding of crystallography, x-ray diffraction, and transmission electron microscopy theories as well as applications. It is written as an introduction to the topic with minimal reliance on advanced mathematics.

Spis treści

Part I: Introduction to Crystallography. Part II: X-ray Diffraction of Materials. Part III: Transmission Electron Microscopy of Materials. Part IV: Summary.