Experimental Techniques for Material Characterization-Part-1

ISBN-13: 9786200254405 / Angielski

Vanarajsinh Solanki; Abhay Dasadia; Pramita Mishra

Opis

This book focus on different material characterization tools focusing on morphology/topology and structural properties of the materials. In the chapter related to morphological characterization tools the book mainly discussed Transmission Electron Microscope (TEM), Scanning Electron Microscope (SEM), and Atomic Force Microscope (AFM) whereas structural characterization chapter includes the details of X-ray Diffractometer (XRD), Neutron diffraction, Raman Microscope, Selected Area Electron Di raction (SAED). Here, we have tried our best to explain each detail of the experimental techniques which will be very helpful to new learners.

O autorze

Solanki, Dr. Vanarajsinh
Dr. Vanaraj Solanki had earned his masters in physics (2008) from S. P. University, VVNagar, and Ph.D from Institute of Physics, Bhubaneswar, India. He has also worked at Materials Research Centre, Indian Institute of Science, Bangalore, during his postdoc. Presently, Dr. Solanki is working as a research Scientist at, KRADLE, CHARUSAT, Changa.