Embedded Mechatronic Systems: Analysis of Failures, Predictive Reliability

ISBN-13: 9781785481895 / Angielski / Twarda / 2019 / 274 str.

Abdelkhalak El Hami; Philippe Pougnet

Spis treści

1. Reliability-Based Design Optimization
2. Non-Destructive Characterization by Spectroscopic Ellipsometry of Interfaces in Mechatronic Devices
3. Method of Characterizing the Electromagnetic Environment in Hyperfrequency Circuits Encapsulated within Metallic Cavities
4. Metrology of Static and Dynamic Displacements and Deformations Using Full-Field Techniques
5. Characterization of Switching Transistors under Electrical Overvoltage Stresses
6. Reliability OF Radio Frequency Power Transistors to Electromagnetic and Thermal Stress
7. Internal Temperature Measurement of Electronic Components
8. Reliability Prediction of Embedded Electronic Systems: the FIDES Guide
9. Study of the Dynamic Contact Between Deformable Solids

O autorze

Abdelkhalak El Hami is Professeur des universités at the Institut National des Sciences Appliquées (INSA-Rouen) in France and is in charge of the Normandy Conservatoire National des Arts et Metiers (CNAM) Chair of Mechanics and Head of the department of mechanical engineering of INSA Normandy, as well as several European pedagogical projects. He is an expert in fluid-structure interaction studies, reliability and optimization.