ELFT Phase II - An Evaluation of Automated Latent Fingerprint Identification Technologies

ISBN-13: 9781499211672 / Angielski / Miękka / 2014 / 108 str.

U. S. Department of Commerce

Opis

The National Institute of Standards and Technology (NIST), with the cooperation of eight technology providers, performed a test of accuracy for searching latent fingerprints when using automatic feature extraction and matching (AFEM). This test is Phase II of the Evaluation of Latent Fingerprint Technology (ELFT) project. The test was open to both the commercial and academic community, and participants included vendors of Automated Fingerprint Identification Systems (AFIS). This report provides the design, process, caveats, results, observations and conclusions of the test.