ISBN-13: 9789201105158 / Angielski / Miękka / 2016 / 1 str.
ISBN-13: 9789201105158 / Angielski / Miękka / 2016 / 1 str.
Ion beam analysis techniques are non-destructive analytical techniques used to identify the composition and provide elemental depth profiles in surface layers of materials. Their reliability and accuracy depends on our knowledge of the nuclear reaction cross sections. This publication describes the coordinated effort to measure, compile and evaluate cross section data relevant to these techniques.