Decision Patterns on Software Metrices for Single& Multiple Projects

ISBN-13: 9783330049550 / Angielski / Miękka / 2017 / 200 str.

Nageswara Rao Moparthi; P. Vidhya Sagar; S. Satyanarayana

Opis

In this research book found the Methods for detecting decision patterns on software metrics for single and associated multiple projects while implantation of SDLC Phases for reinforced taking optimal way for decision making which helps a lot for client in terms of business process improvement.In our first model, a preprocessed based hybrid Bayesian network was implemented to handle large number of metrics for multi-defect decision patterns and other a new ensemble defect prediction classification model was implemented on multiple associated products to predict metric relationship, along with defects patterns and also establishing a new privacy preserving based defect prediction classification model was implemented on multiple associated products to predict metric relationship, along with defects patterns.

O autorze

Dr.M.Nageswara Rao is Distinguished Professor, Inventor, Author and Business leader Born in India. He Received his M.Tech(CSE) & PhD(Computer Science & Technology) from ANU University and SKU University. Dr.M. Nageswara Rao early worked in IT industry with Product and Services related to Software, with few MNC's LIKE IBM,EDS.