Computer Vision Metrics: Survery, Taxonomy and Analysis of Computer Vision, Visual Neuroscience, and Deep Learning

ISBN-13: 9783319815954 / Angielski / Miękka / 2018 / 637 str.

Scott Krig

Spis treści

Image Capture and Representation.- Image Re-processing.- Global and Regional Features.- Local Feature Design Concepts.- Taxonomy of Feature Description Attributes.- Interest Point Detector and Feature Descriptor Survey.- Ground Truth Data, Content, Metrics, and Analysis.- Vision Pipeline and Optimizations.- Feature Learning Architecture Taxonomy and Neuroscience Background.- Feature Learning and Deep Learning Architecture Survey.   

O autorze

Scott Krig is a pioneer in computer imaging, computer vision, and graphics visualization. He founded Krig Research in 1988, providing the world's first image and vision systems based on high-performance engineering workstations, super-computers, and dedicated imaging hardware, serving customers worldwide in 25 countries. Scott has provided imaging and vision solutions around the globe, and has worked closely with many industries including aerospace, military, intelligence, law enforcement, government research, and academic organizations. More recently, Scott has worked for major corporations and startups serving commercial markets, solving problems in the areas of computer vision, imaging, graphics, visualization, robotics, process control, industrial automation, computer security, cryptography, and consumer applications of imaging and machine vision to PCs, laptops, mobile phones, and tablets. Most recently, he provided direction for Intel Corporation in the area of depth-sensing and computer vision methods for embedded systems and mobile platforms. Scott is the author of many patent applications worldwide in the areas of embedded systems, imaging, computer vision, DRM, and computer security, and studied at Stanford.