Capacitance Spectroscopy of Semiconductors

ISBN-13: 9789814774543 / Angielski / Twarda / 2018 / 444 str.

Jian V. Lee; Giorgio Ferrari

Opis

Capacitance spectroscopy refers to techniques for characterizing the electrical properties of semiconductor materials, junctions, and interfaces, all from the dependence of device capacitance on frequency, time, temperature, and electric potential. This book includes 15 chapters written by world-recognized, leading experts in the field, in academia, national institutions, and industry, subdivided into four sections: Physics, Instrumentation, Applications, and Emerging Techniques.