Built in Test for VLSI: Pseudorandom Techniques

ISBN-13: 9780471624639 / Angielski / Twarda / 1987 / 368 str.

Paul H. Bardell; W. H. McAnney; J. Savir

Opis

This handbook provides ready access to all of the major concepts, techniques, problems and solutions in the emerging field of pseudorandom pattern testing. Until now, the literature in this area has been widely scattered, and published work, written by professionals in several disciplines, has treated notation and mathematics in ways that vary from source to source. The main intention of this book is to present the material in a unified manner, making it a useful source for practising professionals and students alike. It opens with a clear description of the shortcomings of conventional testing as applied to complex digital circuits, reviewing by comparison the principles of design for testability of more advanced digital technology. It then offers in-depth discussions of test sequence generation and response data compression, including pseudorandom sequence generators; the mathematics of shift-register sequences and their potential for built-in testing; and various data compression methods, such as polynomial dividers and unique shift-register sequence generators with special applications.

Spis treści

Digital Testing and the Need for Testable Design.

Principles of Testable Design.

Pseudorandom Sequence Generators.

Test Response Compression Techniques.

Shift–Register Polynomial Division.

Special–Purpose Shift–Register Circuits.

Random Pattern Built–In Test.

Built–In Test Structures.

Limitations and Other Concerns of Random Pattern Testing.

Test System Requirements for Built–In Test.

Appendix.

References.

Index.