Built-In-Self-Test and Digital Self-Calibration for RF Socs

ISBN-13: 9781441995476 / Angielski / Miękka / 2011 / 89 str.

Sleiman Sleiman; Mohammed Ismail; Sleiman Bou-Sleiman

Opis

This book introduces design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs).

Spis treści

Introduction and Motivation.- Radio Systems Overview: Architecture, Performance and Built-in-Test.- Efficient Testing for RF SoCs.- RF Built-in-Self-Test.- RF Built-in-Self-Calibration.- Conclusions.