1. Background 2. BSIM-BULK Core Model 3. Real Device Effects 4. Leakage current and thermal effects 5. BSIM-BULK Charge and Capacitance Model 6. Noise and RF Modeling 7. Junction Diode and Layout Dependent Parasitic Model 8. Compact Modeling of High Voltage Devices 9. Parameter Extraction 10. BSIM-BULK Model Quality Testing