Atomic Force Microscopy Fundamentals and Applications

ISBN-13: 9786200247247 / Angielski

Dr. Vanarajsinh Solanki; Dr. Abhay Dasadiya; Dr. Pramita Mishra

Opis

This book focus upon AFM working principle, its different modes (i.e., contact, non-contact and tapping modes), analysis of some AFM result and few applications also. this book also underline the features of AFM as high versatile and useful morphological tool to scan a large variety of surfaces, with a planar resolution ranging from nano -meter sclae down to atomic scale. We hope this book may helpful to researcher and student to understand the basic concept of AFM as well as performing with it for different kind of samples.

O autorze

Solanki, Dr. Vanarajsinh
Dr. Vanaraj Solanki had earned his master(M.Sc) in physics (2008) from S. P. University, VVNagar, and Ph.D from Institute of Physics, Bhubaneswar, India. He has also worked at Materials Research Centre, Indian Institute of Science, Bangalore, during his postdoc. Presently, Dr. Solanki is working as a Research Scientist at, KRADLE, CHARUSAT, Changa.