Atomic Force Microscopy: Fundamental Concepts and Laboratory Investigations

ISBN-13: 9780367218645 / Angielski / Miękka / 2019 / 139 str.

Wesley C. Sanders

Opis

This book focuses primarily on the atomic force microscope, and serves as a reference for students, postdocs, and researchers using atomic force microscopes for the first time. In addition, this book can serve as the primary text for a semester long, introductory course in atomic force microscopy.

Spis treści

1. Introduction to Atomic Force Microscopy 2. Tip-Sample Forces 3. AFM Electronics 4. AFM Cantilevers and Probes 5. Contact Mode AFM 6. Lateral Force Microscopy 7. Conductive Atomic Force Microscopy 8. Oscillating Modes of AFM 9. Image Processing

O autorze

Wesley C. Sanders is currently an assistant professor at Salt Lake Community College. He teaches courses in nanotechnology, materials science, chemistry, and microscopy. While serving as an assistant professor, he has published articles in the Journal of Chemical Education describing undergraduate labs for use in introductory, nanotechnology courses.