Atom Probe Tomography: Put Theory Into Practice

ISBN-13: 9780128046470 / Angielski / Twarda / 2016 / 416 str.

Williams Lefebvre

Opis

Atom Probe Tomography is aimed at beginners and researchers interested in expanding their expertise in this area. It provides the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques, and includes detailed explanations of the fundamentals, the instrumentation, contemporary specimen preparation techniques, and experimental details, as well as an overview of the results that can be obtained. The book emphasizes processes for assessing data quality and the proper implementation of advanced data mining algorithms. For those more experienced in the technique, this book will serve as a single comprehensive source of indispensable reference information, tables, and techniques. Both beginner and expert will value the way the book is set out in the context of materials science and engineering. In addition, its references to key research outcomes based upon the training program held at the University of Rouen-one of the leading scientific research centers exploring the various aspects of the instrument-will further enhance understanding and the learning process.

• Provides an introduction to the capabilities and limitations of atom probe tomography when analyzing materials
• Written for both experienced researchers and new users
• Includes exercises, along with corrections, for users to practice the techniques discussed
• Contains coverage of more advanced and less widespread techniques, such as correlative APT and STEM microscopy

Recenzje

"This book provides a combination of fundamental theory and practical information on atom probe techniques. This book can be used by both beginners and experienced researchers wanting to expand their knowledge in the area of atom probe tomogrophy. While providing the background and necessary fundamentals for the beginner to understand instrumentation, sample preparation, and the expected results that can be obtained, the advanced researcher will benefit from the wealth of information, including tables, references, and techniques found in a single resource." --IEEE Electrical Insulation Magazine

"The combination of theory and practical methods presented in this book make it a very useful resource for the new or seasoned surface scientist." --IEEE Electrical Insulation Magazine

Spis treści

Introduction

Chapter 1. Atom Probe Fundamentals

Chapter 2. Field Ion Emission Mechanisms

Chapter 3. Field Ion Microscopy

Chapter 4. Specimen Preparation by Focused Ion Beam

Chapter 5. Time of Flight Mass Spectrometry and Composition Measurements

Chapter 6. Atom Probe Tomography Detectors

Chapter 7. 3D Reconstructions

Chapter 8. Laser Assisted Field Evaporation

Chapter 9. Data Mining

Chapter 10. Correlative Microscopy by APT and (S)TEM

Chapter 11. Combining APT and Spectroscopy

Conclusion

Appendix

Index

O autorze

Williams Lefebvre, Ph.D., is Associate Professor, Materials Physics Group, University of Rouen, France. He received his Ph.D. in Materials Science in Rouen in 2001 for his correlative analysis by transmission electron microscopy and atom probe tomography (APT) of phase transformations in titanium aluminides. He earned a fellowship to the Japan Society for the promotion of science in 2002, when he visited the NIMS of Tsukuba. Since 2014, he has also been a visiting adjunct research associate professor at the University of Nebraska, Lincoln, USA, where has has been leading research activities in the field of physical metallurgy, focusing on light alloys systems, aiming at improving the methodology associated with the investigation of early stages of precipitation by APT and scanning transmission electron microscopy. Francois Vurpillot, Ph.D., has been Assistant Professor, Materials Physics Group (GPM), University of Rouen, France since 2003. After receiving his Ph.D. at the GPM in 2001, he spent one year at the Department of Materials at the University of Oxford, as a post-doctoral researcher funded by a Marie Curie fellowship support. He is the current vice-president of the International Field Emission Society (IFES) and leader of the Instrumentation team at the GPM. Francois Vurpillot pioneered the combination of experimental and simulated data in APT, which has been a breakthrough in the development of the technique for the nano analysis in material science. Xavier Sauvage, Ph.D., Senior Scientist, Materials Physics Group, University of Rouen, France defended his Ph.D. at the University of Rouen in 2001. The topic was utilizing Atom Probe Tomography (APT) in the investigation of phase transformations in nanoscaled composites processed by severe plastic deformation. After a post-doc position at the Max Planck Institut of Stuttgart, he was hired as research scientist at the Materials Physics Group, University of Rouen to lead some research on nanostructured materials. Dr. Sauvage is now leader of the Materials under Extreme Nanostructures and Energy research team, in which atomic scale microscopy techniques are used for the investigation of fundamental mechanisms in materials under extreme conditions like irradiation or severe plastic deformation.