Atom Probe Field Ion Microscopy

ISBN-13: 9780198513872 / Angielski / Twarda / 1996 / 532 str.

M. K. Miller; G. D. W. Smith; M. G. Hetherington

Opis

The atom probe technique permits the imaging and chemical identification of individual and solid surfaces. It is one of the most important experimental methods in the emerging field of atomic-scale science and technology. This book gives a definitive and up-to-date account of the field, and is written by leading authorities on the subject. It includes recent advances in the method which have allowed for new and exciting applications to emerge in the field of material science, surface science, and catalysis. The book is a state-of-the art account of this important field, and is intended for a graduate-level readership.

Recenzje

For the practising analyst there are nine useful appendices including one on specimen preparation, and the book will be invaluable to researchers in the above fields.

O autorze

Hetherington - deceased