Applied Scanning Probe Methods VIII: Scanning Probe Microscopy Techniques

ISBN-13: 9783540740797 / Angielski / Twarda / 2008 / 465 str.

Bharat Bhushan;Harald Fuchs;Masahiko Tomitori

Opis

The success of the Springer Series Applied Scanning Probe Methods I-VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X). These three volumes complement the previous set of volumes under the subject topics and give insight into the recent work of leading specialists in their respective elds. Following the tradition of the series, the chapters are arranged around techniques, characterization and biomimetics and industrial applications. Volume VIII focuses on novel scanning probe techniques and the understanding of tip/sample interactions. Topics include near eld imaging, advanced AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever systems, combinations of AFM sensors and scanning electron and ion microscopes, calibration methods, frequency modulation AFM for application in liquids, Kelvin probe force microscopy, scanning capacitance microscopy, and the measurement of electrical transport properties at the nanometer scale. Vol. IX focuses on characterization of material surfaces including structural as well as local mechanical characterization, and molecular systems. The volume covers a broad spectrum of STM/AFM investigations including fullerene layers, force spectroscopy for probing material properties in general, biological lms .and cells, epithelial and endothelial layers, medical related systems such as amyloidal aggregates, phospholipid monolayers, inorganic lms on aluminium and copper - ides, tribological characterization, mechanical properties ofpolymernanostructures, technical polymers, and near eld optics.

Spis treści

P.G. Gucciardi, G. Bachelier, S.J. Stranick, and M. Allegrini: Background-free apertureless near-field imaging.- Hao-Chih (Bernard) Liu, Gregory A. Dahlen, Jason R. Osborne: Critical Dimension Atomic Force Microscopy for Sub-50 nm Microelectronics Technology Nodes.- E. Cefalì, S. Patanè, S. Spadaro, R. Gardelli, M. Albani, M. Allegrini: Near Field Probes: from optical fibers to optical nanoantennas.- Sophie Marsaudon, Charlotte Bernard, Dirk Dietzel, Cattien V. Nguyen, Anne-Marie Bonnot, Jean-Pierre Aime, Rodolphe Boisgard: Carbon Nanotubes as SPM Tips: Nanotube Tips Mechanical Properties and Imaging.- H.D. Espinosa and Andrea Ho: Scanning Probes for the Life Sciences.- Hayato Sone and Sumio Hosaka: Self-sensing cantilever sensor for bio-science.- Vinzenz Friedli, Samuel Hoffmann, Johann Michler, and Ivo Utke: AFM Sensors in Scanning Electron and Ion Microscopes: Tools for Nanomechanics, Nanoanalytics, and Nanofabrication.- Peter J. Cumpson, Charles Clifford, Jose Portoles, James Johnstone, and Martin Munz: Cantilever Spring Constant Calibration in Atomic Force Microscopy.- Suzanne P. Jarvis, John E. Sader, Takeshi Fukuma: Frequency Modulation Atomic Force Microscopy in Liquids.- Y. Rosenwaks, O. Tal, S. Saraf, A. Schwarzman, E. Lepkifker, and A. Boag: Kelvin Probe Force Microscopy: Recent Advances and Applications.- Stefan Lanyi: Application of Scanning Capacitance Microscopy to Analysis at the Nanoscale.- Laura Fumagalli, Ignacio Casuso, Giorgio Ferrari and Gabriel Gomila: Probing Electrical transport properties at the nanoscale by current-sensing Atomic Force Microscopy.-

O autorze

Dr. Bharat Bhushan received an M.S. in mechanical engineering from the Massachusetts Institute of Technology in 1971, an M.S. in mechanics and a Ph.D. in mechanical engineering from the University of Colorado at Boulder in 1973 and 1976, respectively, an MBA from Rensselaer Polytechnic Institute at Troy, NY in 1980, Doctor Technicae from the University of Trondheim at Trondheim, Norway in 1990, a Doctor of Technical Sciences from the Warsaw University of Technology at Warsaw, Poland in 1996, and Doctor Honoris Causa from the Metal-Polymer Research Institute of National Academy of Sciences at Gomel, Belarus in 2000. He is a registered professional engineer (mechanical) and presently an Ohio Eminent Scholar and The Howard D. Winbigler Professor in the Department of Mechanical Engineering, Graduate Research Faculty Advisor in the Department of Materials Science and Engineering, and the Director of the Nanotribology Laboratory for Information Storage & MEMS/NEMS (NLIM) at the Ohio State University, Columbus, Ohio. He is an internationally recognized expert of tribology on the macro- to nanoscales, and is one of the most prolific authors in the field. He is considered by some a pioneer of the tribology and mechanics of magnetic storage devices and a leading researcher in the fields of nanotribology and nanomechanics using scanning probe microscopy and applications to micro/nanotechnology.