Anomalous X-Ray Scattering for Materials Characterization: Atomic-Scale Structure Determination

ISBN-13: 9783662146378 / Angielski / Miękka / 2013 / 214 str.

Yoshio Waseda

Opis

The production of multi layered thin films with sufficient reliability is a key technology for device fabrication in micro electronics. In the Co/Cu type multi layers, for example, magnetoresistance has been found as large as 80 % at 4. 2 K and 50 % at room temperature. In addition to such gigantic mag netoresistance, these multi layers indicate anti ferromagnetic and ferromag netic oscillation behavior with an increase in the thickness of the layers of the non magnetic component. These interesting properties of the new synthetic flmctional materials are attributed to their periodic and interracial structures at a microscopic level, although the origin of such peculiar features is not fully understood. Information on the surface structure or the number density of atoms in the near surface region may provide better insight. Amorphous alloys, frequently referred to as metallic glasses, are produced by rapid quenching from the melt. The second generation amorphous alloys, called "bulk amorphous alloys", have been discovered in some Pd based and Zr based alloy systems, with a super cooled liquid region at more than 120 K. In these alloy systems, one can obtain a sample thickness of several centime ters. Growing scientific and technological curiosity about the new amorphous alloys has focused on the fundamental factors, such as the atomic scale struc ture, which are responsible for the thermal stability with certain chemical compositions.

Spis treści

Structural Characterization of Crystalline and Non-crystalline Materials — A Brief Background of Current Requirements.- Experimental Determination of Partial and Environmental Structure Functions in Non-crystalline Systems — Fundamental Aspects.- Nature of Anomalous X-ray Scattering and Its Application to the Structural Analysis of Crystalline and Non-crystalline Systems.- Experimental Determination of the Anomalous Dispersion Factors of X-rays — Theoretical and Experimental Issues.- In-House Equipment and Synchrotron Radiation Facilities for Anomalous X-ray Scattering.- Selected Examples of Structural Determination for Crystalline Materials Using the AXS Method.- Selected Examples of Structural Determination for Non-crystalline Materials Using the AXS Method.- Anomalous Small-Angle X-ray Scattering.- Anomalous Grazing-Incidence X-ray Reflection.- Merits of Anomalous X-ray Scattering and Its Future Prospects.

Blurb

The evolution of our understanding of most properties of new functional materials is related to our knowledge of their atomic-scale structure. To further this, several X-ray and neutron techniques are employed. The anomalous X-ray scattering (AXS) method, exploiting the so-called anomalous dispersion effect near the absorption edge of the constituent element, is one of the most powerful methods for determining the accurate partial structure functions of individual pairs of constituents or the environmental functions around specific elements in multicomponent systems. AXS is useful for both crystalline and non-crystalline systems, for studies of surface and bulk materials. This book is the first on this new method of structural characterization. It describes the basics and application principles, and also treats the specifics of application to liquid alloys, supercooled liquids, solutions, metallic glasses, oxide glasses, superconducting ionic glasses etc.