Analysis of Residual Stress by Diffraction Using Neutron and Synchrotron Radiation

ISBN-13: 9780367446802 / Angielski / Miękka / 2020 / 368 str.

M. E. Fitzpatrick; Alain Lodini

Opis

Neutron and synchrotron X-ray diffraction have emerged as leading techniques for stress analysis. This book presents an overview of the principles of these techniques and examples of their applications to a range of materials and engineering problems. It contains 20 papers from leading international experts in residual stress analysis covering the

Spis treści

Section 1: General applications of neutron and synchrotron radiation to materials research. Section 2: Methods and problems in residual stress determination by diffraction. Section 3: Measurement techniques. Section 4: Areas of study. Section 5: Applications

O autorze

Fitzpatrick, M.E. | Lodini, Alain