An Introduction to X-Ray Crystallography

ISBN-13: 9780521423595 / Angielski / Miękka / 1997 / 416 str.

Michael M. Woolfson

Opis

A textbook for the senior undergraduate or graduate student beginning a serious study of X-ray crystallography. It will be of interest both to those intending to become professional crystallographers and to those physicists, chemists, biologists, geologists, metallurgists and others who will use it as a tool in their research. All major aspects of crystallography are covered--the geometry of crystals and their symmetry, theoretical and practical aspects of diffracting X-rays by crystals and how the data may be analyzed to find the symmetry of the crystal and its structure. Includes recent advances such as the synchrotron as a source of X-rays, methods of solving structures from power data and the full range of techniques for solving structures from single-crystal data. Computer programs are provided for carrying out many operations of data-processing and solving crystal structures including by direct methods. These programs are required for many of the examples given at the end of each chapter but can be used to create new examples by which students can test themselves or each other.

Recenzje

' … highly recommendable to everybody who wishes to understand what he (or she) does when pressing the return key.' P. Luger, Zeitschrift für Kristallographie

Spis treści

Preface to the first edition; Preface to the second edition; 1. The geometry of the crystalline state; 2. The scattering of X-rays; 3. Diffraction from a crystal; 4. The Fourier transform; 5. The experimental collection of diffraction data; 6. The factors affecting X-ray intensities; 7. The determination of space groups; 8. The determination of crystal structures; 9. Accuracy and refinement processes; References; Appendices; Physical constants and tables; Solutions to examples; Bibliography; Index.