Advances in X-Ray Analysis: Volume 27

ISBN-13: 9781461297130 / Angielski / Miękka / 2011 / 596 str.

Jerome B. Cohen; Jerome B. Cohen

Opis

This volume constitutes the proceedings of the 1983 Denver Conference on Applications of X-ray Analysis and is the 27th in the series. The conference was held jointly with the American Crystal- lographic Association at Snowmass Resort, Colorado, from August 1 to 5, 1983. The papers appearing in this volume are only from pre- dominantly Denver Conference (DC) sessions and from joint DC/ACA sessions. The early plans for holding a joint conference were initiated some three years ago by Q. C. Johnson of Lawrence Livermore Lab, J. B. Cohen of Northwestern University and P. K. Predecki of the University of Denver and were eventually brought to fruition by a jOint organizing committee consisting of: O. P. Anderson, Colorado State University (ACA), D. E. Leyden, Colorado State University (DC), R. D. Witters, Colorado School of Mines (ACA) and P. K. Predecki (DC). We take this opportunity to thank the committee members and the early planners for their vision, ingenuity and hard work without which the conference would not have materialized. There was no plenary session in 1983, instead a number of special sessions were organized and chaired by various individuals.

Spis treści

I. J. D. Hanawalt Award Session On Search/Match Methods.- Establishment of the J. D. Hanawalt Award for Excellence in Powder Diffraction and its First Presentation to Ludo K. Frevel.- J. D. Hanawalt Powder Diffraction Award Lecture.- Presentation of the J. D. Hanawalt Award.- Computer Techniques for Faster X-Ray Diffraction Phase Identification.- Fuzzy Sets and Inverted Search—Two Concepts for Compound Identification in Spectra.- PDF Search and Match Algorithms for the Cyber 205 Vector Processor.- A Method of Background Subtraction for the Analysis of Broadened Profiles.- A Combined Derivative Method for Peak Search Analysis.- Experimental Study of Precise Peak Determination in X-Ray Powder Diffraction.- Evaluation of Existing X-Ray Powder Diffraction Standards for Phosphate Minerals.- Data Sets for Evaluation of Powder Diffraction Search/Match Algorithms.- Computer Simulation of Powder Patterns.- II. X-Ray Strain and Stress Determination.- A Useful Guide for X-Ray Stress Evaluation (XSE).- Stress Evaluation on Materials Having Non-Linear Lattice Strain Distributions.- X-Ray Multiaxial Stress Analysis Taking Account of Stress Gradient.- Determining Stresses in the Presence of Nonlinearities in Interplanar Spacing vs. sin2?.- On the Use of Synchrotron Radiation for the Study of the Mechanical Behaviour of Materials.- The Measurement of Elastic Constants for the Determination of Stresses by X-Rays.- X-Ray Strain Measurements in IV-VI-Semiconductor Superlattices at Low Temperature.- Recent Applications of XSA in Heat Treatment and Fatigue of Steels.- Stress Measurement at Fatigue Crack Tip Using PSPC.- Direct X-Ray Measurement of Residual Strains in Textured Steel.- A Study of Plastic Flow and Residual Stress Distribution Caused by Rolling Contact.- X-Ray Fractography on Stress Corrosion Cracking of High Strength Steel.- Determination of Residual Stresses in Transformation-Toughened Ceramics.- Small Area X-Ray Diffraction Techniques; Applications of the Micro-Diffractometer to Phase Identification and Strain Determination.- Residual Stress Relaxation in Cemented Carbide Composites Studied Using the Argonne Intense Pulsed Neutron Source.- Stress Determination in an Adhesive Bonded Joint by X-Ray Diffraction.- III. Position Sensitive Detectors and X-Ray Instrumentation.- Evaluation of Straight and Curved Braun Position-Sensitive Proportional Counters on a Huber-Guinier X-Ray Diffraction System.- A New In Situ, Automatic, Strain-Measuring X-Ray Diffraction Apparatus with PSD.- A Miniature Instrument for Residual Stress Measurement.- A Low-High Temperature Camera for In-Situ X-Ray Diffraction Studies of Catalysts.- A Low Cost Rejuvenation of Old G.E. and Picker X-Ray Generators.- An Inexpensive In-House EXAFS Spectrometer.- Suppression of X-Ray Fluorescence Background in X-Ray Powder Diffraction by a Mercuric Iodide Spectrometer.- Computer-Assisted Alignment of a Guinier X-Ray Powder Diffraction System.- Energy Dispersive Diffraction in a Diamond Anvil High Pressure Cell Using Synchrotron and Conventional X-Radiation.- IV. Quantitative Phase Analysis by XRD.- Reference Intensity Quantitative Analysis Using Thin-Layer Aerosol Samples.- Quantitative Analysis: A Comparative Study Using Mo and Cu Radiation on Coal Related Minerals and Fly Ash.- Multiphase Quantitative Analysis of Colorado Oil Shales Involving Overlap of the Diffraction Peaks.- V. Other XRD Applications.- Evidence for Stacking Faults in Multiaxial Strained Alpha-Brass.- Line Broadening Studies on Highly Defective A12O3 Produced by High Pressure Shock Loading.- Line Broadening Studies on Highly Defective TiO2 Produced by High Pressure Shock Loading.- Examination of the Reaction Kinetics at Solder-Metal Interfaces Via High Temperature X-Ray Diffraction.- High Temperature Guinier X-Ray Diffractometry for Thermal Expansion Measurements in the Hexagonal Form of Cordierite (2MgO·2A12O3·5SiO2).- VI. J. Gilfrich Honorary Session on Trends in XRF Instrumentation.- Continuing Development of Mercuric Iodide X-Ray Spectrometry.- X-Ray Tube Improvements for Better Performance in an Energy-Dispersive X-Ray Spectrometer System.- Comparison of Experimental and Theoretical Intensities for a New X-Ray Tube for Light Element Analysis.- Using a Microcomputer-Controlled Robot Arm as a General Purpose Sample Changer.- VII. Mathematical Models and Computer Applications in XRF.- LAMA III — A Computer Program for Quantitative XRFA of Bulk Specimens and Thin Film Layers.- An Empirical Background Calculation Method for Multi-Channel X-Ray Spectrometers.- Comparison of X-Ray Backscatter Parameters for Complete Sample Matrix Definition.- VIII. Applications of XRF to Archeological, Geochemical and Industrial Materials.- Investigation of Obsidian by Radioisotope X-Ray Fluorescence.- A Comparison of Trace Metal Determinations in Contaminated Soils by XRF and ICAP Spectroscopies.- Determination of Barium and Selected Rare-Earth Elements in Geological Materials Employing a HpGe Detector by Radioisotope Excited X-Ray Fluorescence.- A Versatile XRF Analytical System for Geochemical Exploration and ether Applications.- XRF Analysis of Low Level Cation Concentration of Sodium Silicate Solutions.- A Rapid, Low Cost, Manual Fusion Sample Preparation Technique for Quantitative X-Ray Fluorescence Analysis.- Quantitative X-Ray Fluorescence Analysis for Fly Ash Samples.- IX. Other XRF Applications.- Polarization of X-Rays by Scattering from the Interior of a Cylinder I. Single Scatter.- Polarization of X-Rays by Scattering from the Interior of a Cylinder II. Double Scatter.- Application of a Polarized X-Ray Spectrometer for Analysis of Ash from a Refuse-Fired Steam Generating Facility.- Applications of Room Temperature Energy Dispersive X-Ray Spectrometry Using a Mercuric Iodide Detector.- Wall Effect and Detection Limit of the Proportional Counter Spectrometer.- Determination of Oxygen and Nitrogen in Various Materials by X-Ray Fluorescence Spectrometry.- Trace Element Analysis by Synchrotron Radiation Excited XRF.- X-Ray Fluorescence Spectrometric Analysis of Uncontaminated and Contaminated Tropical Plant Materials for Traces of Heavy Metals.- Author Index.