Advances in Imaging and Electron Physics: Volume 177

ISBN-13: 9780124077027 / Angielski / Twarda / 2013 / 380 str.

Peter Hawkes

Opis

Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

• Contributions from leading authorities
• Informs and updates on all the latest developments in the field

Spis treści

1. Image Segmentation in the ?eld of the Logarithmic Image Processing (LIP) Model. Special Focus on the Hierarchical Ascendant Classi?cation Techniques

Michel Jourlin, Josselin Breugnot, Bassam Abdallah, Joris Corvo, Enguerrand Couka, and Maxime Carre

2. Representations for Morphological Image Operators and Analogies with Linear Operators

Petros Maragos

3. Electron Microscopy at Cambridge University with Charles Oatley and Ellis Cosslett: Some Reminiscences and Recollections.

Kenneth C.A. Smith

4. Advanced Methods of Electron Microscopy in Catalysis ResearchMiguel Jose-Yacaman, Arturo Ponce, Sergio Mejia-Rosales, and Francis Leonard Deepak

O autorze

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.