Advances in Imaging and Electron Physics: Part a Volume 172

ISBN-13: 9780123944221 / Angielski / Twarda / 2012 / 696 str.

Ted Cremer

Opis

This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application.

• Contributions from leading authorities
• Informs and updates on all the latest developments in the field

Spis treści

1. Introduction to Neutron and X-ray Optics

Jay Theodore Cremer

2. Compound Refractive Lenses and Prisms

Jay Theodore Cremer

3. Geometric Neutron and X-ray Optics - Aberrations

Jay Theodore Cremer

4. X-ray Optics

Jay Theodore Cremer

5. Neutron Optics

Jay Theodore Cremer

6. X-ray and Neutron Optics

Jay Theodore Cremer