Advanced Laser Diode Reliability

ISBN-13: 9781785481543 / Angielski / Twarda / 2021 / 200 str.

Laurent Bechou; Mitsuo Fukuda; Giovanna Mura

Opis

Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. The book reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections support this kernel: a) failure analysis techniques, procedures and examples; and, b) device-oriented laser modeling and parameter extraction.

• Provides natural continuity with the most widespread existing textbooks
• Offers an extension to new failure mechanisms, new technologies, new application fields and new environments
• Introduces a specific self-consistent model for the physical description of a laser diode, expressed in terms of practically measurable quantities
• Introduces and explores the application of a practical measurement tool for linking failure modes to failure mechanisms

Spis treści

1. Laser Diode Reliability 2. Multi-Component Model for Semiconductor Laser Degradation 3. Reliability of Laser Diodes for High-Rate Optical Communications - A Monte Carlo-Based Method to Predict Lifetime Distributions and Failure Rates in Operating Conditions 4. Laser Diode Characteristics 5. Laser Diode DC Measurement Protocols

O autorze

Massimo Vanzi is Full Professor of Electronics at the University of Cagliari, Italy. Previously, he worked for 14 years at the Italian telecom company, Telettra, in the Quality and Reliability Department. His research focuses on general reliability, failure physics and diagnostics of solid state devices Laurent Béchou is Full Professor in Electronics and Physics at the University of Bordeaux, France, and Visiting Senior Researcher at the Laboratoire Nanotechnologies et Nanosystèmes (CNRS) at the University of Sherbrooke, Canada. His research mainly addresses advanced electro-optical characterization techniques, physical and failure mechanisms modeling, as well as statistical methods for lifetime prediction of optical devices and emerging photonic systems. Mitsuo Fukuda is Senior Researcher and Professor Emeritus studying plasmonic devices at the Toyohashi University of Technology, Japan. Previously, he was a researcher studying optical semiconductor devices used for various optical fiber communication systems at the NTT Electrical Communication Laboratories. Giovanna Mura is Assistant Professor at the University of Cagliari. Her research is mainly focused on failure physics, diagnostics of microelectronics by electron microscopy (SEM and TEM) and general methods for reliability with a special emphasis on photonic devices.