Advanced Computing in Electron Microscopy

ISBN-13: 9783030332594 / Angielski / Twarda / 2020 / 354 str.

Earl J. Kirkland

Opis

This review of numerical computation methods in high resolution conventional and scanning transmission electron microscope images shows how image calculations help separate information from artifact. Updated with instrumental developments and new references.

Spis treści

Introduction.- The Transmission Electron Microscope.- Linear Image Approximations.- Sampling and the Fast Fourier Transform.- Calculating Images of Thin Specimens.- Calculating Images of Thick Specimens.- Some Worked Examples.- Program Details.- App. A: Atomic Potentials and Scattering Factors.- App. B: The Fourier Projection Theorem.- App. C: Bilinear Interpolation.- App. D: 3D Perspective View.

O autorze

Earl J. Kirkland graduated from Case Western Reserve University with a BS in Physics, and from Cornell University with a PhD in Applied Physics. He currently teaches in the Applied Physics Department at Cornell. 

Blurb

This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.