ISBN-13: 9783030332594 / Angielski / Twarda / 2020 / 354 str.
ISBN-13: 9783030332594 / Angielski / Twarda / 2020 / 354 str.
This review of numerical computation methods in high resolution conventional and scanning transmission electron microscope images shows how image calculations help separate information from artifact. Updated with instrumental developments and new references.