An External Interface for Processing 3-D Holographic and X-Ray Images

ISBN-13: 9783540508229 / Angielski / Miękka / 1989 / 147 str.

Werner Juptner; Thomas Kreis

Opis

Edited in cooperation with the Commission of the European Communities.

Spis treści

1 Introduction.- 1.1 General objectives of ESPRIT project 898.- 1.2 Size and extent of ESPRIT project 898.- 1.3 Roles of the partners of ESPRIT project 898.- 2 Aim of ESPRIT project 898.- 2.1 Holographic interferometry and X-ray radiography: complementary methods.- 2.2 Combined holographic interferometry and X-ray radiography.- 2.3 Architecture of the external interface system.- 3 Deformation measurement by holographic interferometry.- 3.1 Theoretical foundations of holographic interferometry.- 3.2 Structures to be tested holographically.- 3.3 Loading of the structures.- 3.4 Quantitative evaluation of holographic interference patterns.- 3.5 Techniques of quantitative holographic interferometry.- 3.6 Evaluation of holographic interference patterns by the phase step method.- 3.7 Evaluation of holographic interference patterns by the Fourier-transform method.- 3.8 References.- 4 Structural and stress analysis.- 4.1 Analysis methods.- 4.2 The Finite Element program MELINA.- 4.3 Interpolation of holographic data.- 4.4 Software for interpolation and verification.- 4.5 Data formaf for representation of holographic images.- 4.6 Preparation for analysis.- 4.7 Analysis of honeycomb panel.- 5 Component inspection by X-ray radiography.- 5.1 Introduction to X-ray radiography.- 5.2 X-ray inspection system hardware.- 5.3 X-ray inspection system software.- 5.3.1 Software for X-ray tube parameter control.- 5.3.2 Software for manipulator control.- 5.3.3 Software for image enhancement.- 5.3.4 Software for image evaluation.- 5.3.4.1 Evaluation of fiber distribution and orientation.- 5.3.4.2 Evaluation of the honeycomb wall distribution.- 5.4 Summary.- 5.5 Appendix: Tabulated results of conformity tests.- 6 Microfocus X-ray testing.- 6.1 Theory of microfocus system.- 6.1.1 Theory of the micro focus X-ray source.- 6.1.2 The microfocus X-ray tube.- 6.1.3 The parameters of the micro focus X-ray system.- 6.1.4 Specification of the tube parameters.- 6.1.5 Controlling of the acceleration high voltage.- 6.1.6 Controlling of the tube current (mA).- 6.1.7 Controlling the filament current.- 6.1.8 Controlling the impact load on the target.- 6.1.9 Controlling the electron beam.- 6.1.10 Activation and surveillance of the safety and vacuum control system.- 6.1.11 Resolution and focal spot size.- 6.1.12 Some theoretical considerations regarding resolution and focal spot size of micro focus X-ray tubes.- 6.1.13 Theory of application of the microfocus X-ray source.- 6.1.14 The detection of details.- 6.1.15 Theory of application of high energy micro focus X-ray source.- 6.2 The automatic non-destructive testing system description.- 6.2.1 Function and elements.- 6.2.2 System description.- 6.3 The microprocessor controlled microfocus.- 6.3.1 System description of ?P-MF.- 6.3.2 Front panels.- 6.3.2.1 Control module.- 6.3.2.2 List of functions.- 6.3.2.3 Power pack modules.- 6.3.3 Vacuum equipment.- 6.3.4 High voltage generators.- 6.3.4.1 High voltage cathode generator.- 6.3.4.2 High voltage anode generator.- 6.3.4.3 Anodes.- 6.3.4.4 Interconnecting cables.- 6.4 Operation.- 6.4.1 General instructions.- 6.4.2 Exposure menu.- 6.4.3 Exposure control.- 6.4.4 Start-up.- 6.4.5 Electronics of microprocessor control of microfocus unit.- 6.5 Technical description of the manipulator.- 6.5.1 The manipulator in general.- 6.6 Test of the system.- 6.7 Conclusion.- 7 Conclusions and future prospects.