Microelectronic Reliability Vol. I: Test and Diagnostics

ISBN-13: 9780890062845 / Angielski / Twarda / 1989 / 396 str.

Edward B. Hakim; Edward B. Hakim; Edward B. Hakim

Opis

Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test. Provides background on the development of quality assurance and verification procedures. Some of the new changes under development to cope with pressures brought