Preface xiHow to Use This Book xiiiChapter 1 History of Metrology 11.1 Introduction 21.2 The History of Metrology 21.3 The International System of Units (SI) 31.4 The History of the Metric System 31.5 The History of the British Imperial System (IS) 41.6 Evolution of Metrology 131.7 Milestones of Metrology 22Chapter 2 3D Scanning Basics 252.1 Basics of Laser Light Technology 252.2 Laser Safety 252.3 So What Exactly Is a Laser? 282.4 Laser Types 292.5 LIDAR vs Laser-Radar 322.6 Laser-Radar 322.7 Basics of 3D Scanning 352.8 How It Works 352.9 Limitations 352.10 Accuracy 362.11 Modern Metrology 37Chapter 3 Scanning Equipment 393.1 Introduction 393.2 Triangulating Laser Scanners 393.3 Data Acquisition Variables 41Chapter 4 Data Acquisition and Processing Software 654.1 Introduction 654.2 Data Acquisition Software 664.3 Inspection Software 714.4 Data Export Options 724.5 Point Clouds 734.6 Processing and Registration 784.7 Survey Controls 804.8 Polygonal Mesh 814.9 Using Processed Datasets 82Chapter 5 Post-Processing 855.1 Introduction 855.2 Coordinate Systems 865.3 Scaling 935.4 Mapping Techniques 935.5 CAD to Part Comparison 975.6 Root Mean Square and Standard Deviation 985.7 The Method of Least Squares 995.8 What Is Uncertainty? 1025.9 Contributing Factors to Uncertainty 1055.10 Typical Post-processing Workflow 108Chapter 6 Reverse Engineering for Industrial and Consumer Applications 1116.1 Introduction 1116.2 Industrial Applications 1126.3 Case Studies 1186.4 Racing Yacht Boat Build 1186.5 Reverse Engineering: Cessna Caravan Performance Upgrade 1216.6 Replication of a Classic Propeller Design 1236.7 Roller Coaster Inspection 1266.8 Argomaiden Sculpture 129Chapter 7 Reverse Engineering for Architecture, Engineering, and Construction 1337.1 Introduction 1337.2 Modeling for Architects and Engineers 1347.3 Case Studies 1427.4 Research Facility Coordinate Control System 1427.5 Architectural Ornament Replication 1467.6 Fonthill Castle, Bronx, NY 1497.7 Infrastructure Preservation 1537.8 Generating Station Turbine Replacement 158Chapter 8 Future Directions 1618.1 Software Development 1628.2 Technology 1628.3 Extended Reality 1638.4 UAV and AV 1658.5 Industry Trends 1658.6 Summary 168Chapter 9 Resources 1699.1 Units of Measure 1759.2 Coordinate Metrology Society (CMS) Certification 1819.3 Certification Committee 1819.4 CMS Certification Levels 1839.5 CMS Level-Two Certification 1859.6 National Metrology Laboratories and Institutes 187Metrology Glossary 191Index 201
Gary C. Confalone, BSEE, MSME, is the CEO of ECM Global, a company specializing in 3D scanning and reverse engineering. He has spent the past three decades working in the metrology industry with the first half of his career focused on the development of laser-based measurement systems, and processes, for the aerospace industry. He has served as Chair for both the Coordinate Metrology Society and the 3D Certification Committee, and was recently awarded the American Society for Quality (ASQ) Hromi Medal. Gary received a Bachelor's degree from the University of Massachusetts, and a Master's Degree from Boston University.John Smits, AIA, is VP of ECM, AEC Division, a registered architect, and one of the initial adopters of large volume 3D laser scanning technology as applied specifically to the architecture, engineering, and construction professions. He has shared his expertise as a speaker at trade shows, conferences, and online webinars, and authored articles in academic journals and trade magazines. John earned a Bachelor's degree in Architecture from the University of Virginia and a Master's degree in Architecture from Washington University in St. Louis.Thomas Kinnare, BSME, is Principal Engineer and lead developer of the ECM Training Division. Over the past two decades, Tom has been instrumental in the advancement of 3D metrology practices throughout the industry, working to institute an international metrology education and certification training program. He currently serves on the American Society of Mechanical Engineers (ASME) Y14.45, GD&T Reporting Subcommittee, and the Coordinate Measurement Society Certification Committee. Tom earned his Bachelor's degree from Massachusetts Institute of Technology.