fringe 2009: 6th international workshop on advanced optical metrology

ISBN-13: 9783642030505 / Angielski / Twarda / 2009 / 818 str.

Wolfgang Osten

Opis

21 years ago it was a joint idea with Hans Rottenkolber to organize a workshop dedicated to the discussion of the latest results in the automatic processing of fringe patterns. This idea was promoted by the insight that automatic and high precision phase measurement techniques will play a key role in all future industrial and scientific applications of optical metrology. A couple of months later more than 50 specialists from East and West met in East Berlin, the capital of the former GDR, to spend 3 days with the discussion of new principles of fringe processing. In the stimulating atmoshere the idea was born to repeat the workshop and to organize the meeting in an olympic schedule. And thus meanwhile 20 years have been passed and we have today Fringe number six. However, such a workshop takes place in a dynamic environment. Therefore the main topics of the previous events were always adapted to the most interesting subjects of the new period. In 1993 the workshop took place in Bremen and was dedicated to new principles of optical shape measurement, setup calibration, phase unwrapping and nondestructive testing, while in 1997 new approaches in multi-sensor metrology, active measurement strategies and hybrid processing technologies played a central role. 2001, the first meeting in the 21st century, was focused to optical methods for micromeasurements, hybrid measurement technologies and new sensor solutions for industrial inspection.

Spis treści

Key Note.- Holography in the #x0027;60s and #x0027;70s #x2013; A View from the Fringes.- Topic 1: New Methods and Tools for Data Acquisition.- Coherence Holography: A Thought on Synthesis and Analysis of Optical Coherence Fields.- The Polarization Approach in Measuring Correlation Properties of Optical Fields.- Real-time Coherence Holography.- Coherence and Correlation in Digital Holography.- Analysis of fringe formation and localization in optical interferometry using optical coherence.- Quantitative Phase Imaging in Microscopy.- Comparison and unification of speckle-based phase retrieval and holography with applications in phasefront alignment and recognition.- High Precision Object Phase Reconstruction with Modified Phase Retrieval.- Phase retrieval with an LCoS display: characterization and application.- Digital dynamic-fringe pattern processing without frequency carrier, using wideband phase-shifting algorithmsM.- Error-compensating phase-shifting Fizeau interferometry with a wavelength-tunable laser diode.- Lateral Shearing Interferometer based on a Spatial Light Modulator in the Fourier Plane.- Digital phase shifting holography and holographic interferometry.- Fourier-transform method with high accuracy by use of iterative technique narrowing the spectra of a fringe pattern.- Fringe pattern processing using a new adaptive and steereable asynchronous algorithm.- Synthetic Aperture Digital Holography.- A new application of the Delaunay triangulation: The processing of speckle interferometry signals.- Phase analysis of interference signal with optical Hilbert transform based on orthogonal linear polarization phase shifting.- Digital Fourier-transform processing for analysis of speckle photographs.- Wavefront evaluation in phase shifting interferometry based on recurrence fringe processing with 3D prediction.- White-light fringe analysis with low-cost CCD camera.- Design and assessment of Differential Phase-Shifting Algorithms by means of their Fourier representation.- A Nonlinear Technique for Automatic Twin-Image and Zero-Order Term Suppression in Digital Holographic Microscopy.- Modified two-step phase-shifting algorithm: analysis, demonstration, and application.- The Used of Reference Wave for Diagnostics of Phase Singularities.- New convolution algorithms for reconstructing extended objects encoded in digitally recorded holograms.- Reconstruction of noisy measured sharp edges at thin sheet metal components.- Reduction of speckles in digital holographic interferometry.- Normalization and denoising in a multi-source and multi-camera profilometric system.- Automated Phase Map Referencing Against Historic Phase Map Data.- Numerical multiplexing and de-multiplexing techniques for efficient storage and transmission of digital holographic information.- Fringe Pattern Normalization Using Bidimensional Empirical Mode Decomposition and the Hilbert Transform.- Complementary Filtering Approach to Enhance the Optical Reconstruction of Holograms from a Spatial Light Modulator.- Combination of Phase Stepping and Fringe Tracking to Evaluate Strain from Noisy DSPI Data.- Influence of filter operators on 3D coordinate calculation in fringe projection systems.- Polarization interferometry of singular structure of organic crystal polarization properties..- Zero order interferometry technique for measuring the Lyapunov#x2019;s maximal index in optical fields.- Orientation-selective spiral-phase contrast microscopy.- Topic 2: Application Enhanced Technologies.- Model-based white light interference microscopy for metrology of transparent film stacks and optically-unresolved structures.- Limitations and Optimization of Low-coherence Interferometry for High Precision Microscopic Form Measurement.- Instantaneous Wavelength Detection by a Whole-Field k-space Method.- Limiting aspects in length measurements by interferometry.- Aspects of design and the characterization of a high resolution heterodyne displacement interferometer.- The femtosecond optical synthesizer as a tool for determination of the refractive index of air in ultra-precise measurement of lengths.- Digital holographic microscopy with a simultaneous phase-shifting interferometer for measuring the angular spectrum generated by micro-optical structures.- Resolution enhancement in digital holography by a two-dimensional electro-optically tunable phase grating.- Resolution improvement in lensless digital holographic interferometry.- Digital holography catching up with analogue holography both in resolution and in field of view with a bottom-line camera.- Fresnel and Fourier digital holography architectures: a comparison.- The last Word on Three-Flat Calibration #x2212; are we there yet?.- A New Flatness Reference Measurement System Based on Deflectometry and Difference Deflectometry.- Quasi absolute Test for Aspherics via dual Wavefront Holograms and a radial ShearPosition.- Rapid and flexible measurement of precision aspheres.- Measurement of the shape of objects by the interferometry with two wavelengths.- Recording-plane division multiplexing (RDM) in pulsed digital holography for optical metrology.- Identification of deformation components in TV holography and digital holography.- Extending the capabilities of the sphere interferometer of PTB by a stitching procedure.- Fringe contrast improving in low coherence interferometry by white light emitting diodes spectrum shaping.- Absolute testing of aspherics in transmitted light using an amplitude DOE.- MEMS Calibration Standards for the Optical Measurement of Displacements.- About the feasibility of nearfield-farfield transformers based on optical metamaterials.- Analogy of white-light interferometry and pulse shaping.- Topic 3: 4D Optical Metrology over a Large Scale.- Nanomeasuring and Nanopositioning Engineering.- Reconstruction of Shape using Gradient Measuring Optical Systems.- Metrological SPM with positioning controlled by green light interferometry.- Measuring Shape and Surfaces down to the Nanometer and Nanosecond scales by Digital Holographic Microscopy.- Deflectometry: 3D-Metrology from Nanometer to Meter.- 3-D Sensing for Microstructures Using Dynamic DOEs.- Doppler phase-shift fringe analysis and digital holography using high-speed digital camera.- Shape and Deformation Measurement of Moving Object by Sampling Moir#x00E9; Method.- New Interferometry Tools for AeroOptics.- Dynamic Fizeau Interferometers.- Surface contouring of vibrating objects using quadrature transform.- Development and Application of a 10#x00A0;Hz Nd:YAG Double Pulse Laser for Vibration Measurements with Double Pulse ESPI.- Combining novel fringe analysis and photogrammetry for industrial shape measurement.- Digital holographic interferometry for deformation measurement by means of an acoustical device.- Pump-probe interference microscope observation for femtosecond-laser induced phenomena.- Three-dimensional shape measurement of dynamic objects with spatially isolated surfaces.- Optical design of a DOE-based laser interferometer for inspection of MEMS/MOEMS.- Time Resolved High Resolution Shape and Colour Measurement using Fringe Projection.- Dynamic 3-D shape measurement techniques with marked fringes tracking.- Optical measurement and color map projection system to highlight geometrical features on free form surfaces.- Digital holographic recording of large scale objects for metrology and display.- Multiwavelength laser interferometry.- Accurate and fast three-dimensional imaging with use of fringe projection profilometry.- 3D vibration analysis of granular materials with two-color digital Fresnel holography.- System for transient spatio-temporal (4D) vibration imaging and non-destructive inspection.- Microelements vibration measurement using quasi-heterodyning method and smart-pixel camera.- Dynamic multipoint vibrometry using spatial light modulators.- Topic 4: Hybrid Measurement Techniques.- Optoelectronic method for device characterization and experimental validation of operational performance.- Computational inverse holographic imaging: toward perfect reconstruction of wavefield distributions.- Cooperative Sensor Approach for holistic geometrical Measurement Tasks on Cutting Tools.- View Planning for 3D Reconstruction using Time-of-Flight Camera Data as a-priori Information.- Stereo vision based approach for extracting features from digital holograms.- Flexible Combination of Optical Metrology Strategies for the Automated Assembly of Solid State Lasers.- A Numerical Simulation Benchmark of Tilt Scanning Interferometry for 3D Metrology.- A virtual telecentric fringe projection system.- Inspection of an extended surface by an active 3D multiresolution technique.- Automated Multiscale Measurement System for micro optical elements.- Simulation based sensitivity analysis and optimization of Scatterometry measurements for future semiconductor technology nodes.- Electronic Speckle Pattern Interferometry at Long Infrared Wavelengths. Scattering Requirements.- Topic 5: New Optical Sensors and Measurement.- Novel interferometric measurement systems for the characterization of micro-optics.- Design of a micro-optical low coherent interferometer array for the characterisation of MEMS and MOEMS.- Looking for a new generation of MEMS-type confocal microscopes.- Radial in-plane achromatic digital speckle pattern interferometer using an axis-symmetrical diffractive optical element.- Wavefront Sensor Design based on a Micro-Mirror Array for a High Dynamic Range Measurement at a High Lateral Resolution.- Intellectual property in industry and academia: where interests merge?.- Moir#x00E9; interferometer for surface mapping with liquid crystal grids.- High resolution tilt scanning interferometry system for full sensitivity depth-resolved displacement measurements in weakly scattering materials.- Multifunctional phase-stepping interferometer for measurement in real time.- A Wonderful World of Holography, Interferometry, and Optical Testing.- Multifunctional Encoding System for Assessment of Movable Cultural Heritage.- Investigation of electronic PCB component with two-color digital holographic interferometry.- Integrated Microinterferometric Sensor.- High Precision Measurement of plane-parallel Parts.- Lateral Shearing Interferometry with Simultaneous Detection of both Gradient Fields on a Common Detector Grid.- Near infrared large aperture (24 inches) interferometer system development.- Interior Geometry Inspection Using Rerouted Fringe Projection.- A Cellular Force Microscopic System for Cell Mechanics Investigation.- Candle flame analysis by digital three-wavelength holographic interferometry.- Moir#x00E9; fringe generation and phase shifting using a consumer product LCD projector.- Speckle velocimetry for high accuracy and multidimensional odometry.- Determination of Refractive Index Changes in Biconical Optical Fiber Taper.- Prosthodontic crown mechanical integrity study using Speckle Interferometry.- Monitoring of Drying Process of Paints using Lensless Fourier Transform Digital Holography.- On the Digital Holographic Interferometry of Fibrous Materials: Opto-Mechanical Properties of Fibres.- Geometrical camera calibration using lasers and diffractive optical elements.- Measurement of the local displacement field produced by a microindentation using speckle interferometry. Its application to analyse coating adhesion.- Space-Time Multiplexing in a Stereo-photogrammetry Setup.- Interference Investigation of Concrete Structure and Dynamics During Hydration..- Off-axis Reconstruction Method for Displacement and Strain Distribution Measurement with Phase-Shifting Digital Holography.- #x201C;Flying Triangulation#x201D;: A motion-robust optical 3D sensor principle.- Laser direct writing of high resolution structures on curved substrates: evaluation of the writing precision.

O autorze

Prof Dr. Wolfgang Osten is head of the Institute of Technical Optics.

Blurb

The purpose of the Fringe Proceedings is to present to engineers, scientists and industrial experts the state-of-the-art and the impact of Optical Metrology in Imaging, Surface Monitoring, Stress Analysis, Non-Destructive Testing, Quality Control, and related fields.

Topics of particular interest are:

• New Methods and Tools for the Generation, Acquisition, Processing, and Evaluation of Data in Optical Metrology (Digital Wavefront Engineering)
• Application Enhanced Technologies in Optical Metrology (Addressing enhanced Resolution, Reliability and Flexibility)
• 4D Optical Metrology over a Large Scale Range (from Macro to Nano)
• Hybrid Measurement Techniques (Sensor Fusion and the Unification of Modeling, Simulation and Experiment)
• New Optical Sensors and Measurement Systems for Industrial Inspection.

Special emphasis is put on modern measurement strategies, taking into account the active combination of physical modelling, computer aided simulation and experimental data acquisition. Special emphasis is directed towards new approaches for the extension of existing resolution limits that open the gates to wide scale metrology, ranging from nano to macro, by using advanced optical sensor systems.