Specimen Preparation for Transmission Electron Microscopy of Materials

ISBN-13: 9780198564034 / Angielski / Miękka / 1984 / 46 str.

Peter J. Goodhew

Opis

In this handbook the requirements of a specimen for both imaging and analysis are discussed first. The methods by which sheets of disc specimens can be prepared and final thinning techniques (electropolishing and ion beam thinning) are described with particular reference to the practical problems which are likely to be encountered. The procedures for the preparation of replicas (mainly extraction) and the methods of mounting specimens in the transmission electron microscope are described. The handbook also guides the reader to the most appropriate choice of specimen preparation method and gives practical hints on how to recognise and avoid artefacts which may arise.

Spis treści

1 The specimen: what we are trying to achieve -- 1.1 Thinking ahead -- 1.2 The ideal specimen -- 2 Initial preparation of sheet or disc -- 2.1 Cutting the slice -- 2.2 Preparing flat faces -- 2.3 Chemical thinning solutions -- 2.4 Making a disc -- 3 Final thinning -- 3.1 Electropolishing -- 3.2 Thinning a sheet: the window technique -- 3.3 Thinning a disc: the automatic jet polisher -- 3.4 Recipes for electropolishing -- 3.5 Ion beam thinning -- 3.6 Other final thinning techniques -- 3.7 Thinning specific regions of a sample -- 3.8 Thin foils from just beneath the surface -- 3.9 Cross-sections perpendicular to the original surface -- 4 Replicas -- 4.1 The role of the replica in modern microscopy -- 4.2 The extraction replica -- 5 Mounting and storing specimens -- 5.1 Grids -- 5.2 Disc specimens -- 5.3 Thinned foils -- 5.4 Support films -- 5.5 Specimen storage -- Appendix. Materials and suppliers -- References -- Index.

O autorze

Department of Materials Science and Engineering, University of Surrey.