Nanocharacterization Techniques

ISBN-13: 9780323497787 / Angielski / Twarda / 2017 / 222 str.

Osvaldo De Oliveira Jr; Ferreira L. G. Marystela; Fabio De Lima Leite

Opis

Nanocharacterization Techniques covers the main characterization techniques used in nanomaterials and nanostructures. The chapters focus on the fundamental aspects of characterization techniques and their distinctive approaches. Significant advances that have taken place over recent years in refining techniques are covered, and the mathematical foundations needed to use the techniques are also explained in detail. This book is an important reference for materials scientists and engineers looking for a through analysis of nanocharacterization techniques in order to establish which is best for their needs.

• Includes a detailed analysis of different nanocharacterization techniques, allowing readers to explore which one is best for their particular needs
• Provides examples of how each characterization technique has been used, giving readers a greater understanding of how each technique can be profitably used
• Covers the mathematical background needed to utilize each of these techniques to their best effect, meaning that readers can gain a full understanding of the theoretical principles behind each technique covered
• Serves as an important, go-to reference for materials scientists and engineers

Spis treści

1. Scanning Electron Microscopy 2. Atomic Force Microscopy: A Powerful Tool for Electrical Characterization 3. Spectroscopic Techniques for Characterization of Nanomaterials 4. Dynamic Light Scattering Applied to Nanoparticle Characterization 5. X-Ray Diffraction and Scattering by Nanomaterials 6. Surface Plasmon Resonance (SPR) for Sensors and Biosensors