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Handbook of Metrology and Applications

ISBN-13: 9789819920730 / Angielski

Dinesh K. Aswal; Sanjay Yadav; Toshiyuki Takatsuji
Handbook of Metrology and Applications Dinesh K. Aswal Sanjay Yadav Toshiyuki Takatsuji 9789819920730 Springer - książkaWidoczna okładka, to zdjęcie poglądowe, a rzeczywista szata graficzna może różnić się od prezentowanej.

Handbook of Metrology and Applications

ISBN-13: 9789819920730 / Angielski

Dinesh K. Aswal; Sanjay Yadav; Toshiyuki Takatsuji
cena 5649,17 zł
(netto: 5380,16 VAT:  5%)

Najniższa cena z 30 dni: 5012,24 zł
Termin realizacji zamówienia:
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​This handbook provides comprehensive and up-to-date information on the topic of scientific, industrial and legal metrology. It discusses the state-of-art review of various metrological aspects pertaining to redefinition of SI Units and their implications, applications of time and frequency metrology, certified reference materials, industrial metrology, industry 4.0, metrology in additive manufacturing, digital transformations in metrology, soft metrology and cyber security, optics in metrology, nano-metrology, metrology for advanced communication, environmental metrology, metrology in biomedical engineering, legal metrology and global trade, ionizing radiation metrology, advanced techniques in evaluation of measurement uncertainty, etc. The book has contributed chapters from world’s leading metrologists and experts on the diversified metrological theme. The internationally recognized team of editors adopt a consistent and systematic approach and writing style, including ample cross reference among topics, offering readers a user-friendly knowledgebase greater than the sum of its parts, perfect for frequent consultation. Moreover, the content of this volume is highly interdisciplinary in nature, with insights from not only metrology but also mechanical/material science, optics, physics, chemistry, biomedical and more. This handbook is ideal for academic and professional readers in the traditional and emerging areas of metrology and related fields.

​This handbook provides comprehensive and up-to-date information on the topic of scientific, industrial and legal metrology. It discusses the state-of-art review of various metrological aspects pertaining to redefinition of SI Units and their implications, applications of time and frequency metrology, certified reference materials, industrial metrology, industry 4.0, metrology in additive manufacturing, digital transformations in metrology, soft metrology and cyber security, optics in metrology, nano-metrology, metrology for advanced communication, environmental metrology, metrology in biomedical engineering, legal metrology and global trade, ionizing radiation metrology, advanced techniques in evaluation of measurement uncertainty, etc. The book has contributed chapters from world’s leading metrologists and experts on the diversified metrological theme. The internationally recognized team of editors adopt a consistent and systematic approach and writing style, including ample cross reference among topics, offering readers a user-friendly knowledgebase greater than the sum of its parts, perfect for frequent consultation. Moreover, the content of this volume is highly interdisciplinary in nature, with insights from not only metrology but also mechanical/material science, optics, physics, chemistry, biomedical and more. This handbook is ideal for academic and professional readers in the traditional and emerging areas of metrology and related fields.

Kategorie:
Technologie
Kategorie BISAC:
Technology & Engineering > Measurement
Technology & Engineering > Nanotechnology & MEMS
Wydawca:
Springer
Język:
Angielski
ISBN-13:
9789819920730

Metrology: An Introduction

International and National Metrology: Evolution
Basics of Metrology
Metrology and Comfort Index
Quality and Accreditation
Accreditation in the life of general citizen of India
Quality Measurement and Relevant Indian Infrastructure
National and International Quality Infrastructure
Fundamentals of SI units and Their relevance: Base and Derived units
Redefined SI Units
Realization of the New Kilogram Using 28Si-Enriched Spheres and Dissemination of Mass Standards in Japan
Redefined Quantum Mass: The State of the Art
Optical frequency comb for realization of SI unit meter
Quantum Definition of Kelvin and Way Forward
Realization of Candela: Past, Present and Future
The Mole and the New System of Units
Progress of Quantum Hall Research for Disseminating the Redefined SI
Advances in Quantum Pascal (Pa)
Time and Frequency Metrology: An Introduction
Atomic Timescales
Atomic Frequency Standards
Precise time transfer techniques - Part I: Telephone, LWR and Network
Precise time transfer techniques - Part II: GNSS
Precise time transfer techniques - Part III: TWSTFT
Certified Reference Materials (CRMs): An Introduction
Monitoring of Development of Certified Reference Material of Biodiesel by High Field NMR Spectroscopic Techniques Screen reader support enabled
Bharatiya Nirdeshak Dravya for Antibiotics and Pesticide: Reference materials for food analysis
Bharatiya Nirdeshak Dravya for assessing mechanical properties: Reference materials for Materials science
Role of Certified Reference Materials in Standardization, Quality Control and Quality Assurance
Bharatiya Nirdeshaka Dravyas for Precious metals
Role of Indian Reference Materials for the Calibration of Sophisticated Instruments
Certified Reference Materials for Qualifying Biomaterials
Alloys as Certified Reference Materials (CRMs) Ferrous & Non-Ferrous in Global Perspectives – A Review
Ensuring the Quality of Cement and Building Materials for Civil Infrastructure
Petroleum based Indian Reference Materials (BND): Production and Dissemination
Industrial Metrology: An Introduction
Physical Metrology
High Voltage Metrology
Ultrasonic Non Destructive Testing for the Material Inspection
Pressure and Temperature Measurements and Their Calibrations
Industrial Metrology
Mechanical and Thermo-physical Properties of Condensed Materials
Hardness metrology
Torque Metrology
Recent trends and diversity in Ultrasonics
Industrial Metrology for Water and Gas Flow
Calibration for Snow & Avalanche Sensors
Pressure and its Measurement: An Introduction
Techniques for Industrial Vacuum Metrology
Application of Biomass from Microalgae as Biodiesel
Industry 4.0 and Engineering Metrology A Preamble
Internet of Things (IoT): Introduction and relevance to Industry 4.0
Artificial intelligence for dimensional metrology
Metrology for Smart Precision Agriculture
Industry 4.0 and Engineering Metrology, Role of the sensors: A Perspective
Artificial Intelligence Implementation and Obstacles in Industry 4.0
Fusion of Smart Meteorological Sensors, Remote Sensing Techniques and IoT in Context of Indusry 4.0
Metrology in Machine Learning for Disorder Diagnosis
Additive manufacturing: brief introduction
Metrology in Manufacturing
Metrology requisite in additive metrology
Additive Manufacturing Metrology: Challenges
Metrological assessment in additive manufacturing: Measurement Techniques
Digital Transformation of Metrology In India: An Introduction
Digital Transformation in Metrology for Industry 4.0
Industrial Metrology and IoT
Digital transformation in Dimensional metrology
Role of IoT in Smart Precision Agriculture
Soft Metrology Concept and challenges from uncertainty estimation
Digital Transformation and Industry 5.0 for Next Generation
Optical metrology: Introduction and applications
Surface Metrology
Optical Dimensional Metrology
3D Imaging Systems for Optical Metrology
3D Scanners in futuristic metrology
Nano Metrology: Overview
Optics and Metrology
Anatomically Real Numerical Optical Phantoms: A Study
Industrial and biological applications of liquid lenses in microscopy
Metrology for Advanced Communication and Its Implications
Quantum Microwave Measurements
Microwave Material Measurements
Phased Array Antenna for Radar Application
Antennas for mm-wave MIMO RADAR: Design and Integration Challenges for Automotive Applications
Radar Cross-Section (RCS) Estimation and Reduction
Environmental Metrology: An introduction
Environment Metrology: Physical quantities of sound and expanding demand for acoustic measurements
Noise pollution measurements, mapping and Control
Energy and environment
Development of calibrated and validated SODAR with reference of Air Quality Management
Ambient air quality during crop residue burning and its effect on respiratory parameters of human beings
Measurements of Indoor Air Quality: Science and Applications
Appropriate instruments for monitoring air pollution and air quality
Greenhouse gases measurements - CO2, Methane (CH4), Nitrous oxide (N2O)
Water, Soil quality measurements
Traceability in Environment Metrology
Emissions of Green House Gases: Measurement and Reporting
Precision measurements in health care systems and devices
Metrology in robotic surger
Metrological aspects of blood pressure measurement
Tomography of worn surfaces in arthroplasty/metrology in biomedical engineering
Biomedical metrology
Wireless ultrasonic powering medical devices: Role of measurement techniques
Measuring Cognition: Advances in EEG and fNIRS
Metrological aspects of Surface electromyogram signal acquisition, processing and applications design
Methodologies for Nanomedicine in diagnosis and therapy
Disease prediction in soft tissues organs: Use of metrological characteristics
Artificial Intelligence for iris-based diagnosis in Healthcare
Use of metrological characteristics in ultrasound imaging and artificial intelligence techniques for disease prediction in soft tissues organs
Legal Metrology: Introduction and Scope
Legal Metrology and Global Trade
Standardization and Regulatory Ecosystem in India
Sanctity of Calibrations: Vital for the Export of Indian Products
Understanding the requirements of national legal metrology System
International cooperation in the field of legal metrology
Legal Metrology and Its Social Impacts
Radiation Metrology and Standards: Preamble and Forward
Basics of Ionizing Radiation
Radiation Dosimetry
Ionization Radiation Metrology
Equipment for Environmental Radioactivity Measurement: Calibration and Traceability
Radiation Metrology and application
Occupational radiation monitoring in Indian nuclear Industry
Development of standards for NORMS in Environmental Surveillance
Concepts of Ionizing Radiation Metrology in Medical Radiation Physics
Advanced Techniques in Evaluation of Measurement Uncertainty: A Prelude
Monte Carlo uncertainty for partial differential equation based measurement models
Modern approaches to statistical estimation of measurements in the locationmodel and regression
The Quantifying of Uncertainty in Measurement
Advanced Techniques in Evaluation of Measurement Uncertainty
Mechanical & Metallurgical Testing & Calibration, CRM Production, Proficiency Testing, Statics related to Measurement Uncertainty
Application of Contemporary Techniques of Evaluation of Measurement Uncertainty in Pressure Transducer: A Case Study

Dr. D.K. Aswal is present Director of Health, Safety and Environment Group, Bhabha Atomic Research Center, Mumbai. He is an accomplished scientist of international repute in the areas of metrology and condensed matter research (molecular electronics, organic solar cells, thermoelectrics, superconductivity, low-dimensional materials, and gas sensors etc.). His current focus is to enhance the Metrological capabilities of India at par with international standards and to strengthen the "Quality-infrastructure (metrology, accreditation and standards)" of India for inclusive growth and for its quick transformation from a developing-state to a developed-state. His "Aswal Model" puts accurate and precise measurements traceable to SI units at the core of four helices (government, academia, industry and civil society) responsible for the inclusive growth. He has edited nine books, contributed over 30 book chapters, published over 500 research papers (H-index of 53) and filed nine patents. He is an elected fellow of National Academy of Sciences, India (NASI); Academician, Asia Pacific Academy of Materials; Fellow, International Academy of Advanced Materials (Sweden). He had visiting Professor/scientist positions at Institut d 'Electronique de Microelectronique et de Nanotechnologie (France), Shizuoka University (Japan), Commissariat à l'Energie Atomique (France), Weizmann Institute of Science (Israel), University of Yamanashi (Japan), University of Paris VII (France), Karlsruhe Institute of Technology (Germany), University of South Florida (USA), etc. He is recipient of several international/national fellowships, including JSPS (Japan), BMBF (Germany), EGIDE (France), Homi Bhabha Science and Technology Award, DAE-SRC outstanding Research Investigator Award, HBNI Distinguished Faculty award etc.  He has also served as Chairman (Interim), National Accreditation board of Testing and Calibration laboratories (NABL), Gurugram (2019-2020); Director, Additional Charge, CSIR-Central Electronic Research Institute, Pilani (2019-2020); Director, Additional Charge, CSIR-NISTADS, New Delhi (2018-2019) and Secretary, Atomic Energy Education Society (AEES), Mumbai (2012-2015).

 

Prof. Sanjay Yadav, born in 1962, obtained his master degree in science (M.Sc.) in 1985 and Ph.D. degree in Physics in 1990. Presently, he is working as the Editor-in-Chief (EIC) of the MAPAN: The Journal of Metrology Society of India. He is also Vice President of Metrology Society of India (MS), New Delhi as well as Vice President of Ultrasonic Society of India (USI), New Delhi. He is Former Chief Scientist and Head, Physico Mechanical Metrology Division of NPL and also Former Professor, Faculty of Physical Sciences, Academy of Scientific and Innovative Research (AcSIR), HRDG, Ghaziabad. He had taught ‘Advanced Measurement Techniques & Metrology’ course, taken practical classes and supervising graduate, master and Ph.D. students since 2011. He is the recipient of research scholarships from Ministry of Home Affairs, India (1986); CSIR, India (1988); Col. G.N. Bajpayee Award of Institution of Engineers, India (1989); Commendation Certificates from Haryana Government (1991 & 1992); JICA Fellowship of JAPAN (1998), Commendation Certificates from SASO, Saudi Arabia (2003); 3 Appreciation Certificates from Director, NPL (2005); Managing Editor, MAPAN (2006-2014); nominated as Member of APMP Technical Committee of Mass Related Quantities (TCM), Australia (2013-2019); Nominated as Country Representative in APMP, China (2019); Vice President, Metrology Society of India (2020); Member, National Advisory Committee, NCERT, Delhi (2019); Members, Testing and Calibration Advisory Committee, BIS (2019, 2020 and 2021), and very recently received a prestigious International award i.e. APMP Award for Developing Economies, China (2020). He has significantly contributed in the field of pressure metrology, biomedical instrumentation, ultrasonic transducers and instrumentation systems. His current research interests include research and developmental activities in physico mechanical measurements; establishment, realization, maintenance and up-gradation of national pressure and vacuum standards; dissemination of national practical pressure scale to users through apex level calibration, training and consultancy services; inter-laboratory comparisons, proficiency testing programme and key comparisons, implementation of Quality System in the laboratory as per ISO/IEC 17025 standard and Finite Element Analysis (FEA) and Monte Carlo Simulations for pressure balances. He has published more than 450 research papers in the national and international journals of repute and conferences, 20 books, 14 patents and copyrights, supervised 8 PhDs (another 5 in waiting), drafted several projects, scientific and technical reports, documents and policy papers.

Dr. Toshiyuki TAKATSUJI, a mechanical Engineer joined National Research Laboratory of Metrology (NRLM) in 1990. He also served as Visiting Scientist, National Measurement Laboratory, and Australia during 1994-1996; The NRLM reorganized to NMIJ, AIST in 2001 and since then he is working in NMIJ on various scientific projects and also playing leadership role in APMP, serving as its Chairman from 2016-2019. In world metrology arena, his contributions to dimensional metrology would always be the talking and reference points. He has been actively working not only in scientific but also in legal metrology area as a member of International Committee of Legal Metrology (CIML).

 

Prem Rachakonda is a mechanical engineer in the Intelligent Systems Division at the National Institute of Standards and Technology (NIST), USA. His work primarily addresses technical and standardization activities for industrial metrology, automation, autonomous vehicle perception, and strategic planning. His current work is focused on developing the necessary measurement science to verify and validate 3D vision systems used for manufacturing automation, and autonomous vehicle applications. Additionally, he has previously worked on developing standards for 3D lidars and developing technology for achieving nanoscale measurements. His work is now part of an ASTM standard adopted by measurement software and hardware companies. He holds several leadership roles on standards development task groups with organizations such as ISO, ASTM & SAE and is on the editorial boards of multiple scientific journals.

 

Dr. Harish Kumar received B.Tech. degree in Mechanical and Automation Engineering from the Guru Gobind Singh Indrapsatha University, New Delhi, India, in 2003 and the Ph.D. degree in Mechanical Engineering from Guru Gobind Singh Indraprastha University, New Delhi, India, in 2015. His thesis was on design and development of force transducers. He worked at National Physical Laboratory, New Delhi, India during 2007 to 2017 as Scientist and worked in the force and mass metrology. He has worked in the design and development of Kibble balance. Since 2017, he has been working at National Institute of Technology Delhi, India, and currently working in additive manufacturing in addition to metrology. He has published more than 100 papers in peer-reviewed journals/conferences of repute.




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