Advances in Imaging and Electron Physics: Silicon-Based Millimetre-Wave Technology Volume 174

ISBN-13: 9780123942982 / Angielski / Twarda / 2012 / 484 str.

Jamal Deen

Opis

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

• Contributions from leading authorities
• Informs and updates on all the latest developments in the field

Spis treści

1. Measurement Techniques and Practical Issues

Jamal Deen

2. Transmission lines and passive components

Guennadi A. Kouzaev

3. Modeling and Design of High Frequency Structures Using Artificial Neural Networks and Space Mapping

Mohamed Bakr

4. Field-effect types of transistors

Benjamin Iniguez

5. RF MEMS Switches and Switch Matrices

Mojgan Daneshmand

6. Substrate-Integrated Antennas on Silicon

Natalia K. Nikolova